Tekmark has long served as a partner to leading designers and manufacturers of semiconductor and other electronic components. We pride ourselves on being able to provide complete solutions for applications such as jitter and noise measurements, power measurements, EMI troubleshooting, and memory test.


Source: Keysight

Link: Characterization of PCB Insertion Loss with a New Calibration Method

In this application note a new method for characterizing PCB loss by using AFR with 1X Open fixtures is proposed.

Source: Keysight

Link: WaferPro Express Software

WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

Source: Keysight

Link: The World's Highest Pin Count In-Circuit Test Solutions

Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world's highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

Source: Keysight

Link: i3070 High Node Count Test Solution - Technical Overview

Keysight's high node count test solution allows any Keysight 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system.

Source: Keysight

Link: Model Quality Assurance (MQA)

MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

Source: Keysight

Link: Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer

This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.


Source: Keysight

Link: Keysight WaferPro Express

The Keysight WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.

Source: Keysight

Link: How to Extract SRAM Models

This video shows how to extract SRAM device models efficiently on Keysight's device modeling platform.

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